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Vue d'ensemble
G茅nie 茅lectrique : The course is to orient designers of VLSI chips and boards to think about testing problems in parallel with the design process. Consideration in structured design-for-testability as a requirement for complex systems will be emphasized; as well as the emerging concept of built-in self-test (BIST).
Terms: This course is not scheduled for the 2016-2017 academic year.
Instructors: There are no professors associated with this course for the 2016-2017 academic year.
(3-0-9)
Prerequisite: B.Eng. or equivalent.